Patent details

EP3062082 Title: Preparation of sample for charged-particle microscopy

Basic Information

Publication number:
EP3062082
PCT Application Number:
Type:
European Patent Granted for LU
Legal Status:
Lapsed
Application number:
EP151565462
PCT Publication Number:
First applicant's nationality:
Translation Language:
EPO Publication Language:
English
English Title of Invention:
Preparation of sample for charged-particle microscopy
French Title of Invention:
Préparation d'un échantillon cryogénique pour une microscopie à particules chargées
German Title of Invention:
Herstellung einer Probe für Ladungsteilchenmikroskop
SPC Number:

Dates

Filing date:
25/02/2015
Grant date:
18/04/2018
EP Publication Date:
31/08/2016
PCT Publication Date:
Claims Translation Received Date:
Translations Received Date (B1 EP Publication):
Translations Received Date (B2 EP Publication):
Translations Received Date (B3 EP Publication):
Publication date:
18/04/2018
EP B1 Publication Date:
18/04/2018
EP B2 Publication Date:
EP B3 Publication Date:
Lapsed date:
25/02/2019
Expiration date:
25/02/2035
Renunciation date:
Revocation date:
Annulment date:

Owner

From:
11/04/2018
 
 

Name:
FEI COMPANY
Address:
5350 NE Dawson Creek Drive, Hillsboro, Oregon 97124-5793, United States (US)

Inventor

Name:
Rémigy, Hervé-William
Address:
Netherlands (NL)

Classification

IPC classification:
G01N 1/28; G01N 1/42; H01J 37/20; H01J 37/26;

Publication

European Patent Bulletin

Issue number:
201816
Publication date:
18/04/2018
Description:
Grant (B1)

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