Patent details

EP3514484 Title: OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD

Basic Information

Publication number:
EP3514484
PCT Application Number:
Type:
European Patent Granted for LU
Legal Status:
Lapsed
Application number:
EP181995077
PCT Publication Number:
First applicant's nationality:
Translation Language:
EPO Publication Language:
English
English Title of Invention:
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
French Title of Invention:
DISPOSITIF ET PROCÉDÉ DE MESURE OPTIQUE
German Title of Invention:
OPTISCHE MESSVORRICHTUNG UND OPTISCHES MESSVERFAHREN
SPC Number:

Dates

Filing date:
10/10/2018
Grant date:
05/01/2022
EP Publication Date:
24/07/2019
PCT Publication Date:
Claims Translation Received Date:
Translations Received Date (B1 EP Publication):
Translations Received Date (B2 EP Publication):
Translations Received Date (B3 EP Publication):
Publication date:
05/01/2022
EP B1 Publication Date:
05/01/2022
EP B2 Publication Date:
EP B3 Publication Date:
Lapsed date:
10/10/2022
Expiration date:
10/10/2038
Renunciation date:
Revocation date:
Annulment date:

Owner

From:
29/12/2021
 
 

Name:
OMRON CORPORATION
Address:
801, Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-Ku, Kyoto-shi, Kyoto 600-8530, Japan (JP)

Inventor

1

Name:
KAJII, Yosuke
Address:
Japan (JP)

2

Name:
MATOBA, Kenichi
Address:
Japan (JP)

3

Name:
KONDO, Tomonori
Address:
Japan (JP)

Priority

Priority Number:
2018006541
Priority Date:
18/01/2018
Priority Country:
Japan (JP)

Classification

IPC classification:
G01B 11/02;

Publication

European Patent Bulletin

Issue number:
202201
Publication date:
05/01/2022
Description:
Grant (B1)

Annual Fees

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Annual Fee Number:
Expected Payer:
Last Annual Fee Payment Date:
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Payer:
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