Patent details

EP4049045 Title: CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENT

Basic Information

Publication number:
EP4049045
PCT Application Number:
US2020046677
Type:
European Patent Granted for LU
Legal Status:
In force
Application number:
EP207620162
PCT Publication Number:
WO2021080670
First applicant's nationality:
Translation Language:
EPO Publication Language:
English
English Title of Invention:
CLOSED-LOOP CONTROL OF RF TEST ENVIRONMENT
French Title of Invention:
RÉGULATION EN BOUCLE FERMÉE D'UN ENVIRONNEMENT DE TEST RF
German Title of Invention:
REGELUNG EINER HF-PRÜFUMGEBUNG IM GESCHLOSSENEN REGELKREIS
SPC Number:

Dates

Filing date:
17/08/2020
Grant date:
25/09/2024
EP Publication Date:
31/08/2022
PCT Publication Date:
29/04/2021
Claims Translation Received Date:
Translations Received Date (B1 EP Publication):
Translations Received Date (B2 EP Publication):
Translations Received Date (B3 EP Publication):
Publication date:
25/09/2024
EP B1 Publication Date:
25/09/2024
EP B2 Publication Date:
EP B3 Publication Date:
Lapsed date:
Expiration date:
17/08/2040
Renunciation date:
Revocation date:
Annulment date:

Owner

From:
18/09/2024
 
 

Name:
Raytheon Company
Address:
870 Winter Street, Waltham, Massachusetts 02451-1449, United States (US)

Inventor

1

Name:
RUSSELL, Aubrey J.
Address:
United States (US)

2

Name:
VAHEY, Scott W.
Address:
United States (US)

Priority

Priority Number:
201916660325
Priority Date:
22/10/2019
Priority Country:
United States (US)

Classification

IPC classification:
G01R 29/08;

Publication

European Patent Bulletin

Issue number:
202439
Publication date:
25/09/2024
Description:
Grant (B1)

Annual Fees

Annual Fee Due Date:
01/09/2025
Annual Fee Number:
6
Annual Fee Amount:
66 Euro
Expected Payer:
Last Annual Fee Payment Date:
Last Annual Fee Paid Number:
Payer:
Filing date Document type Number of pages