Patent details

EP3062082 Title: Preparation of sample for charged-particle microscopy

Basic Information

Publication number:
EP3062082
WO Application Number:
Type:
European Patent Granted for LU
Legal Status:
In force
Application number:
EP151565462
WO Publication Number:
First applicant's nationality:
Translation Language:
EPO Publication Language:
English
English Title of Invention:
Preparation of sample for charged-particle microscopy
French Title of Invention:
Préparation d'un échantillon cryogénique pour une microscopie à particules chargées
German Title of Invention:
Herstellung einer Probe für Ladungsteilchenmikroskop
SPC Number:

Dates

Filing date:
25/02/2015
Grant date:
18/04/2018
EP Publication Date:
31/08/2016
WO Publication Date:
Claims Translation Received Date:
Translations Received Date (B1 EP Publication):
Translations Received Date (B2 EP Publication):
Translations Received Date (B3 EP Publication):
Publication date:
18/04/2018
EP B1 Publication Date:
18/04/2018
EP B2 Publication Date:
EP B3 Publication Date:
Lapsed date:
Expiration date:
25/02/2035
Renunciation date:
Revocation date:
Annulment date:

Applicant

From:
11/04/2018
 
 

Name:
FEI COMPANY
Address:
5350 NE Dawson Creek Drive, Hillsboro, Oregon 97124-5793, United States (US)

Inventor

Name:
Rémigy, Hervé-William
Address:
Narbonnehof 20, 5627 GX Eindhoven, Netherlands (NL)

Classification

IPC or IDT classification:
G01N 1/28; H01J 37/26; H01J 37/20; G01N 1/42;

Publication

European Patent Bulletin

Issue number:
201816
Publication date:
18/04/2018
Description:
Grant (B1)

Annual Fee

Annual Fee(s) Due Date:
02/09/2019
Annual Fee Number:
5
Annual Fee Amount:
52 Euro
Penalty Fee Amount:
20 Euro
Expected Payer:
Last Annual Payment Date:
Last Annual Fee Paid Number:
Payer:
Filing date Document type Number of pages