Patent details
EP0928486 Title: DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRATED CIRCUIT MODULE
Basic Information
- Publication number:
- EP0928486
- PCT Application Number:
- PCT/US/97/14564
- Type:
- European Patent Granted for LU
- Legal Status:
- Lapsed
- Application number:
- EP979384161
- PCT Publication Number:
- WO/98/12706
- First applicant's nationality:
- Translation Language:
- EPO Publication Language:
- English
- English Title of Invention:
- DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRATED CIRCUIT MODULE
- French Title of Invention:
- DISPOSITIF ET PROCEDE D'ESSAI DES DES D'UN CIRCUIT INTEGRE DANS UN MODULE DE CIRCUIT INTEGRE
- German Title of Invention:
- VERFAHREN UND VORRICHTUNG ZUM PRÜFEN INTEGRIERTER SCHALTKREISCHIPS IN EINEM INTEGRIERTEN SCHALTKREISMODUL
- SPC Number:
Dates
- Filing date:
- 20/08/1997
- Grant date:
- 14/11/2001
- EP Publication Date:
- 14/11/2001
- PCT Publication Date:
- 26/03/1998
- Claims Translation Received Date:
- Translations Received Date (B1 EP Publication):
- Translations Received Date (B2 EP Publication):
- Translations Received Date (B3 EP Publication):
- Publication date:
- 14/07/1999
- EP B1 Publication Date:
- 14/11/2001
- EP B2 Publication Date:
- EP B3 Publication Date:
- Lapsed date:
- 20/08/2002
- Expiration date:
- 20/08/2017
- Renunciation date:
- Revocation date:
- Annulment date:
Owner
- From:
- 20/08/1997
- Name:
- MICRON TECHNOLOGY INC.
- Address:
- 8000 South Federal Way, Boise, ID 83707-0006, United States (US)
Inventor
1
- Name:
- WARK James, M.
- Address:
- United States (US)
2
- Name:
- NELSON Eric, S.
- Address:
- United States (US)
3
- Name:
- DUESMAN Kevin, G.
- Address:
- United States (US)
4
- Name:
- FARNWORTH Warren, M.
- Address:
- United States (US)
Priority
- Priority Number:
- 718173
- Priority Date:
- 19/09/1996
- Priority Country:
- United States (US)
Classification
- Main IPC Class:
- G11C 29/00;
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