Patent details

EP0928486 Title: DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRATED CIRCUIT MODULE

Basic Information

Publication number:
EP0928486
PCT Application Number:
PCT/US/97/14564
Type:
European Patent Granted for LU
Legal Status:
Lapsed
Application number:
EP979384161
PCT Publication Number:
WO/98/12706
First applicant's nationality:
Translation Language:
EPO Publication Language:
English
English Title of Invention:
DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRATED CIRCUIT MODULE
French Title of Invention:
DISPOSITIF ET PROCEDE D'ESSAI DES DES D'UN CIRCUIT INTEGRE DANS UN MODULE DE CIRCUIT INTEGRE
German Title of Invention:
VERFAHREN UND VORRICHTUNG ZUM PRÜFEN INTEGRIERTER SCHALTKREISCHIPS IN EINEM INTEGRIERTEN SCHALTKREISMODUL
SPC Number:

Dates

Filing date:
20/08/1997
Grant date:
14/11/2001
EP Publication Date:
14/11/2001
PCT Publication Date:
26/03/1998
Claims Translation Received Date:
Translations Received Date (B1 EP Publication):
Translations Received Date (B2 EP Publication):
Translations Received Date (B3 EP Publication):
Publication date:
14/07/1999
EP B1 Publication Date:
14/11/2001
EP B2 Publication Date:
EP B3 Publication Date:
Lapsed date:
20/08/2002
Expiration date:
20/08/2017
Renunciation date:
Revocation date:
Annulment date:

Owner

From:
20/08/1997
 
 

Name:
MICRON TECHNOLOGY INC.
Address:
8000 South Federal Way, Boise, ID 83707-0006, United States (US)

Inventor

1

Name:
WARK James, M.
Address:
United States (US)

2

Name:
NELSON Eric, S.
Address:
United States (US)

3

Name:
DUESMAN Kevin, G.
Address:
United States (US)

4

Name:
FARNWORTH Warren, M.
Address:
United States (US)

Priority

Priority Number:
718173
Priority Date:
19/09/1996
Priority Country:
United States (US)

Classification

Main IPC Class:
G11C 29/00;
Filing date Document type Number of pages