Patent details

Basic Information

Publication number:

EP1324006

PCT Application Number:

Type:

European Patent Granted for LU

Legal Status:

Lapsed

Application number:

EP020276747

PCT Publication Number:

First applicant's nationality:

Translation Language:

EPO Publication Language:

English

English Title of Invention:

Simultaneous self-calibrated sub-aperture stitching for surface figure measurement ( interferometer )

French Title of Invention:

Adaption simultanée et auto-étalonnée des ouvertures partielles pour mesurer la forme d'une surface ( interferomètre )

German Title of Invention:

Gleichzeitige und sich selbst kalibrierende Anpassung von Subaperturen zur Messung von Oberflächenformen ( Interferometer )

SPC Number:

Dates

Filing date:

12/12/2002

Grant date:

29/03/2006

EP Publication Date:

29/03/2006

PCT Publication Date:

Claims Translation Received Date:

Translations Received Date (B1 EP Publication):

Translations Received Date (B2 EP Publication):

Translations Received Date (B3 EP Publication):

Publication date:

02/07/2003

EP B1 Publication Date:

29/03/2006

EP B2 Publication Date:

EP B3 Publication Date:

Lapsed date:

12/12/2006

Expiration date:

12/12/2022

Renunciation date:

Revocation date:

Annulment date:

Owner

From:

30/11/2006

 

 

Name:

QED TECHNOLOGIES INTERNATIONAL INC.

Address:

870 N. Commons Drive, Aurora, IL 60504, United States (US)

Inventor

1

Name:

Murphy Paul E.

Address:

United States (US)

2

Name:

Forbes Gregory

Address:

Australia (AU)

3

Name:

Golini Donald

Address:

United States (US)

Priority

1

Priority Number:

341549 P

Priority Date:

18/12/2001

Priority Country:

United States (US)

2

Priority Number:

303236

Priority Date:

25/11/2002

Priority Country:

United States (US)

Classification

Main IPC Class:

G01B 11/255;

Filing date	Document type	Number of pages