Patent details
EP1943531 Title: IC TESTING METHODS AND APPARATUS
Basic Information
- Publication number:
- EP1943531
- PCT Application Number:
- PCT/IB/2006/053754
- Type:
- European Patent Granted for LU
- Legal Status:
- Lapsed
- Application number:
- EP068095819
- PCT Publication Number:
- WO/2007/049171
- First applicant's nationality:
- Translation Language:
- EPO Publication Language:
- English
- English Title of Invention:
- IC TESTING METHODS AND APPARATUS
- French Title of Invention:
- PROCEDES ET APPAREILS PERMETTANT DE TESTER DES CIRCUITS INTEGRES
- German Title of Invention:
- IC-TESTVERFAHREN UND VORRICHTUNG
- SPC Number:
Dates
- Filing date:
- 12/10/2006
- Grant date:
- 31/03/2010
- EP Publication Date:
- 31/03/2010
- PCT Publication Date:
- 03/05/2007
- Claims Translation Received Date:
- Translations Received Date (B1 EP Publication):
- Translations Received Date (B2 EP Publication):
- Translations Received Date (B3 EP Publication):
- Publication date:
- 16/07/2008
- EP B1 Publication Date:
- 31/03/2010
- EP B2 Publication Date:
- EP B3 Publication Date:
- Lapsed date:
- 12/10/2010
- Expiration date:
- 12/10/2026
- Renunciation date:
- Revocation date:
- Annulment date:
Owner
- From:
- 12/10/2006
- Name:
- NXP B.V.
- Address:
- High Tech Campus 60, 5656 AG Eindhoven, Netherlands (NL)
Inventor
- Name:
- WAAYERS Tom
- Address:
- United Kingdom (GB)
Priority
- Priority Number:
- 05109892
- Priority Date:
- 24/10/2005
- Priority Country:
- European Patent Office (EPO) (EP)
Classification
- Main IPC Class:
- G01R 31/3185;
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