Patent details

EP2631631 Title: PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE

Basic Information

Publication number:
EP2631631
PCT Application Number:
PCT/JP/2011/076151
Type:
European Patent Granted for LU
Legal Status:
Lapsed
Application number:
EP118437623
PCT Publication Number:
WO/2012/070414
First applicant's nationality:
Translation Language:
EPO Publication Language:
Not available
English Title of Invention:
PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE
French Title of Invention:
DISPOSITIF D'ANALYSE PHOTOMÉTRIQUE ET PROCÉDÉ D'ANALYSE PHOTOMÉTRIQUE UTILISANT LA CARACTÉRISTIQUE DE LONGUEUR D'ONDE DE LUMIÈRE ÉMISE DEPUIS UNE SEULE PARTICULE LUMINEUSE
German Title of Invention:
PHOTOMETRISCHE ANALYSEVORRICHTUNG UND PHOTOMETRISCHES ANALYSEVERFAHREN UNTER VERWENDUNG VON WELLENLÄNGENEIGENSCHAFTEN EINES AUS EINEM EINZIGEN LEUCHTENDEN TEILCHEN EMITTIERTEN LICHTS
SPC Number:

Dates

Filing date:
14/11/2011
Grant date:
20/01/2016
EP Publication Date:
20/01/2016
PCT Publication Date:
31/05/2012
Claims Translation Received Date:
Translations Received Date (B1 EP Publication):
Translations Received Date (B2 EP Publication):
Translations Received Date (B3 EP Publication):
Publication date:
28/08/2013
EP B1 Publication Date:
20/01/2016
EP B2 Publication Date:
EP B3 Publication Date:
Lapsed date:
14/11/2016
Expiration date:
14/11/2031
Renunciation date:
Revocation date:
Annulment date:

Owner

From:
19/09/2016
 
 

Name:
Olympus Corporation
Address:
2951 Ishikawa-machi, Hachioji-shi,, Tokyo 192-8507, Japan (JP)

Inventor

1

Name:
HANASHI Takuya
Address:
Japan (JP)

2

Name:
TANABE Tetsuya
Address:
Japan (JP)

3

Name:
YAMAGUCHI Mitsushiro
Address:
Japan (JP)

Priority

Priority Number:
2010262267
Priority Date:
25/11/2010
Priority Country:
Japan (JP)

Classification

Main IPC Class:
G01N 21/64;

Annual Fees

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Expected Payer:
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Payer:
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