Patent details
EP2972429 Title: AN ANALOG BLOCK AND TEST BLOCKS FOR TESTING THEREOF
Basic Information
- Publication number:
- EP2972429
- PCT Application Number:
- US2014025438
- Type:
- European Patent Granted for LU
- Legal Status:
- Lapsed
- Application number:
- EP147194567
- PCT Publication Number:
- WO2014159909
- First applicant's nationality:
- Translation Language:
- EPO Publication Language:
- English
- English Title of Invention:
- AN ANALOG BLOCK AND TEST BLOCKS FOR TESTING THEREOF
- French Title of Invention:
- BLOC ANALOGIQUE ET BLOCS DE TEST POUR LE TESTER
- German Title of Invention:
- ANALOGER BLOCK UND TESTBLÖCKE ZU DESSEN ÜBERPRÜFUNG
- SPC Number:
Dates
- Filing date:
- 13/03/2014
- Grant date:
- 25/12/2019
- EP Publication Date:
- 20/01/2016
- PCT Publication Date:
- 02/10/2014
- Claims Translation Received Date:
- Translations Received Date (B1 EP Publication):
- Translations Received Date (B2 EP Publication):
- Translations Received Date (B3 EP Publication):
- Publication date:
- 25/12/2019
- EP B1 Publication Date:
- 25/12/2019
- EP B2 Publication Date:
- EP B3 Publication Date:
- Lapsed date:
- 13/03/2020
- Expiration date:
- 13/03/2034
- Renunciation date:
- Revocation date:
- Annulment date:
Owner
- From:
- 18/12/2019
- Name:
- Xilinx, Inc.
- Address:
- 2100 Logic Drive, San Jose, California 95124, United States (US)
Inventor
- Name:
- AZAD, Sarosh, I.
- Address:
- United States (US)
Priority
- Priority Number:
- 201313802223
- Priority Date:
- 13/03/2013
- Priority Country:
- United States (US)
Classification
- IPC classification:
- G01R 31/3167; G01R 31/317; G06F 11/27; G01R 31/367;
Publication
European Patent Bulletin
- Issue number:
- 201952
- Publication date:
- 25/12/2019
- Description:
- Grant (B1)
Annual Fees
- Annual Fee Due Date:
- Annual Fee Number:
- Expected Payer:
- Last Annual Fee Payment Date:
- Last Annual Fee Paid Number:
- Payer:
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