Patent details
EP2975525 Title: SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD
Basic Information
- Publication number:
- EP2975525
- PCT Application Number:
- JP2014001289
- Type:
- European Patent Granted for LU
- Legal Status:
- Lapsed
- Application number:
- EP147653059
- PCT Publication Number:
- WO2014141660
- First applicant's nationality:
- Translation Language:
- EPO Publication Language:
- English
- English Title of Invention:
- SYSTEM ANALYSIS DEVICE, AND SYSTEM ANALYSIS METHOD
- French Title of Invention:
- DISPOSITIF ET PROCÉDÉ D'ANALYSE DE SYSTÈME
- German Title of Invention:
- SYSTEMANALYSEVORRICHTUNG UND SYSTEMANALYSEVERFAHREN
- SPC Number:
Dates
- Filing date:
- 07/03/2014
- Grant date:
- 10/10/2018
- EP Publication Date:
- 20/01/2016
- PCT Publication Date:
- 18/09/2014
- Claims Translation Received Date:
- Translations Received Date (B1 EP Publication):
- Translations Received Date (B2 EP Publication):
- Translations Received Date (B3 EP Publication):
- Publication date:
- 10/10/2018
- EP B1 Publication Date:
- 10/10/2018
- EP B2 Publication Date:
- EP B3 Publication Date:
- Lapsed date:
- 07/03/2019
- Expiration date:
- 07/03/2034
- Renunciation date:
- Revocation date:
- Annulment date:
Owner
- From:
- 03/10/2018
- Name:
- NEC Corporation
- Address:
- 7-1, Shiba 5-chome Minato-ku, Tokyo 108-8001, Japan (JP)
Inventor
- Name:
- NATSUMEDA, Masanao
- Address:
- Japan (JP)
Priority
- Priority Number:
- 2013050629
- Priority Date:
- 13/03/2013
- Priority Country:
- Japan (JP)
Classification
- IPC classification:
- G05B 23/02; G06F 11/32; G06F 11/34; G06F 17/50;
Publication
European Patent Bulletin
- Issue number:
- 201841
- Publication date:
- 10/10/2018
- Description:
- Grant (B1)
Annual Fees
- Annual Fee Due Date:
- Annual Fee Number:
- Expected Payer:
- Last Annual Fee Payment Date:
- Last Annual Fee Paid Number:
- Payer:
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