Patent details

Basic Information

Publication number:

EP1426771

PCT Application Number:

PCT/JP/2002/009136

Type:

European Patent Granted for LU

Legal Status:

Lapsed

Application number:

EP027679208

PCT Publication Number:

WO/2003/023419

First applicant's nationality:

Translation Language:

EPO Publication Language:

Not available

English Title of Invention:

IMPEDANCE MEASURING CIRCUIT AND CAPACITANCE MEASURING CIRCUIT

French Title of Invention:

CIRCUIT DE MESURE DE L'IMPEDANCE ET CIRCUIT DE MESURE DE LA CAPACITE

German Title of Invention:

IMPEDANZMESSSCHALTUNG UND KAPAZITÄTSMESSSCHALTUNG

SPC Number:

Dates

Filing date:

06/09/2002

Grant date:

02/11/2006

EP Publication Date:

02/11/2006

PCT Publication Date:

20/03/2003

Claims Translation Received Date:

Translations Received Date (B1 EP Publication):

Translations Received Date (B2 EP Publication):

Translations Received Date (B3 EP Publication):

Publication date:

09/06/2004

EP B1 Publication Date:

02/11/2006

EP B2 Publication Date:

EP B3 Publication Date:

Lapsed date:

06/09/2007

Expiration date:

06/09/2022

Renunciation date:

Revocation date:

Annulment date:

Owner

From:

06/09/2002

 

 

Name:

Hokuto Electronics Inc.

Address:

2-16, Higashikubo, Najio, Nishinomiya-shi, Hyogo 669-1148, Japan (JP)

Name:

TOKYO ELECTRON LIMITED

Address:

3-6 Akasaka 5-chome, Minato-ku, Tokyo 107-8481, Japan (JP)

Inventor

1

Name:

IKEUCHI,N c/o Tokyo Electron Limited

Address:

Japan (JP)

2

Name:

MATSUMOTO,T c/o Tokyo Electron Limited

Address:

Japan (JP)

3

Name:

NAKANO Koichi c/o HOKUTO ELECTRONICS, INC.

Address:

Japan (JP)

4

Name:

YAKABE,M c/o Tokyo Electron Limited

Address:

Japan (JP)

Priority

Priority Number:

2001269991

Priority Date:

06/09/2001

Priority Country:

Japan (JP)

Classification

Main IPC Class:

G01R 27/26;

Filing date	Document type	Number of pages