Patent details
EP1732080 Title: Method for extracting the distribution of charge stored in a semiconductor device
Basic Information
- Publication number:
- EP1732080
- PCT Application Number:
- Type:
- European Patent Granted for LU
- Legal Status:
- Lapsed
- Application number:
- EP051096006
- PCT Publication Number:
- First applicant's nationality:
- Translation Language:
- EPO Publication Language:
- English
- English Title of Invention:
- Method for extracting the distribution of charge stored in a semiconductor device
- French Title of Invention:
- Procédé pour extraire la distribution de charge enregistrée dans un dispositif à semi-conducteurs
- German Title of Invention:
- Extraktionsverfahren für die Lastverteilung in einem Halbleiterbauelement
- SPC Number:
Dates
- Filing date:
- 14/10/2005
- Grant date:
- 24/09/2008
- EP Publication Date:
- 24/09/2008
- PCT Publication Date:
- Claims Translation Received Date:
- Translations Received Date (B1 EP Publication):
- Translations Received Date (B2 EP Publication):
- Translations Received Date (B3 EP Publication):
- Publication date:
- 13/12/2006
- EP B1 Publication Date:
- 24/09/2008
- EP B2 Publication Date:
- EP B3 Publication Date:
- Lapsed date:
- 14/10/2008
- Expiration date:
- 14/10/2025
- Renunciation date:
- Revocation date:
- Annulment date:
Owner
- From:
- 16/07/2009
- Name:
- IMEC
- Address:
- Kapeldreef 75, 3001 Leuven, Belgium (BE)
Inventor
- Name:
- Furnémont Arnaud
- Address:
- Belgium (BE)
Priority
1
- Priority Number:
- 687076 P
- Priority Date:
- 03/06/2005
- Priority Country:
- United States (US)
2
- Priority Number:
- 704859 P
- Priority Date:
- 01/08/2005
- Priority Country:
- United States (US)
Classification
- Main IPC Class:
- G11C 16/26;
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